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Focused Ion Beam (FIB)


Model and main parameters:

FEI (美国) Manufacturer: FEI (USA)

FEI- Scios 2 Hivac Model: FEI- Scios 2 Hivac

The main parameters:

3nm@30KV Ion beam resolution is less than 3nm @ 30KV

workspace<1nm@15KV workspace<1.6nm@15KV Electron beam resolution: workspace <1nm @ 15KV , workspace <1.6nm@15KV

XY 方向移动范围不低于 110nm Z 方向不低于 60 nm ,可绕 Z 轴旋转任(360 ° The moving range of the sample in the XY direction is not less than 110nm , the Z direction is not less than 60nm , and it can rotate around the Z axis (360 ° )

T 范围不小于 -15 90 ° Intention angle tilt angle T range is not less than -15 to 90 °


Uses and functions:

形貌, Scanning electron microscopy is mainly used to observe, analyze, and record the micro- morphology of samples .

离子束用于样品微纳米尺度下的切割、表面修饰、TEM制样 Focused ion beam for cutting, surface modification and TEM sample preparation

主要用于样品 元素分析 Etching energy spectrometer is mainly used for sample element analysis


Features:

Dual beams of ion beam and electron beam for simultaneous observation of focused ion beam FIB cutting and SEM morphology


Scanning electron microscope (SEM)


Model and main parameters

(德国) Manufacturer: ZEISS (Germany)

Model: GEMINI 300

The main parameters:

1.2nm @15 KV Resolution: 0.7 nm @ 15 KV , 1.2nm @ 15 KV

Magnification: 12 x- 2000000x

Accelerating voltage: 0.2-30kV

-4°-70° (倾斜),360° (旋转) 5-axis sample stage: 130 mm (X direction), 130 mm (Y direction), 50 mm (Z direction), -4 ° -70 ° (inclined), 360 ° (rotated)


Uses and functions:

Scanning electron microscopy is mainly used to observe, analyze, and record the micro-morphology of samples.

Energy spectrometer is mainly used for elemental analysis of samples


Features:

High-resolution surface topography imaging


X-Ray Photoelectron Spectrometer (XPS)
Ultraviolet Photoelectron Spectrometer (UPS)



Model and main parameters

(美国) Manufacturer: thermofisher (USA)

Model: ESCALAB Xi +

The main parameters:

XPS energy resolution ≤0.43 eV

5/2 (FWHM≤1.0 eV)强度大于10 6 CPS Sensitivity: Large area XPS, Ag3d 5/2 (FWHM≤1.0 eV) intensity greater than 10 6 CPS

Angular Resolution ARXPS Analysis

Ultraviolet Photoelectron Spectroscopy (UPS)


Uses and functions:

It is used for the chemical composition, deep analysis of valence states, imaging analysis, and work function analysis and characterization of several atomic layers (1-10 nm) on the surface of various organic and inorganic materials such as powders, films, and blocks.


Features:

High-resolution XPS, UPS


X-ray diffractometer (XRD)




Model and main parameters

Manufacturer: Bruker (Germany)

Model: D8 ADVANCE

The main parameters:

X-ray tube: Cu target ceramic X-ray tube, power 2.2 KW

Scanning method: vertical θ / θ goniometer

Rotation range: -10 ° -168 °, minimum step size: 0.0001 °

Energy dispersive array detector


Uses and functions:

Qualitative and quantitative analysis of phases

Micro-optical structure analysis (microcrystalline size, micro stress)

Powder data structure and structure refinement

Small-angle X-ray scattering


Features:

探测器,可测试小角度XRD Full-row detector for testing small-angle XRD


Atomic force microscope (AFM)




Model and main parameters

Manufacturer: Bruker (Germany)

Model: Dimension ICON

The main parameters:

μm x 90 μ m, 90 μm x 90 μ m scanning range ,

m, 10 μm vertical scanning range,

Sample size up to 210mm in diameter and 15mm in thickness


Uses and functions:

Surface morphology, roughness, phase diagram test

Force curve and other mechanical properties test

Electrical properties such as electrostatic force microscope (EFM), Kelvin probe force microscope (KPFM), piezoelectric force microscope (PFM), conductive atomic force microscope test (C-AFM)


Features:

High-resolution topography imaging, electrical performance test modules such as EFM, PFM, KPFM, C-AFM


  Nuclear magnetic resonance spectrometer (NMR)



 厂家:Bruker(德国) 型号:AVANCE NEO 400MHz 主要参数: 射频频率范围:6-440MHz,频率分辨率≤0.005Hz 灵敏度:1H≥500:1,13C≥220:1,15N≥25:1,31P≥150:1,19F≥500:1 可测C13DEPT,二维谱Cosy、Noesy、HMBC、HSQC Model and main parameters Manufacturer: Bruker (Germany) Model: AVANCE NEO 400MHz Main parameters: RF frequency range: 6-440MHz, frequency resolution ≤ 0.005Hz Sensitivity: 1H≥500: 1, 13C≥220: 1, 15N≥25: 1,31P≥150: 1, 19F≥500: 1 can measure C13DEPT, two-dimensional spectrum Cosy, Noesy, HMBC, HSQC 
 
   Uses and functions: 
  Mainly used in organic compound analysis and performance research 
 
 
  Features: 
 
  Bruker's new spectrometer, quick NMR results 
  Laser confocal Raman spectrometer (Raman) 
               

 Model and main parameters 
 
  Manufacturer: Renishaw (UK) 
  Model: InVia Spectrometer 
  The main parameters: 
  μm 532 nm, 785 nm wavelength laser with laser spot less than 0.8 μm 
  -1 -9000cm -1 ,785nm包含50 cm -1 -4000 cm -1 Raman frequency shift range: 532 nm contains 50cm -1 -9000cm -1 , 785nm contains 50 cm -1 -4000 cm -1 
  Sensitivity: no less than 30: 1, third-order and fourth-order peaks of silicon can be observed 
  Spectral repeatability: better than ± 0.02cm -1 , can realize mapping function 
 
   Uses and functions: 
  Mainly applied to the analysis of molecular composition, structure and relative content of various substances, to realize the identification and qualitative research of substances 
 
 
  Features: 
 
  532 nm, 785 nm Dual Wavelength Laser, Raman Mapping 
 
 
  contact details: 
 
 
  电话: 0512-62316061,18962592662(殷老师) Telephone: 0512-62316061, 18962592662 (Ms. Yin) 
  Email: jczx@ataebrahimi.com, yiny @ ataebrahimi.com, songxx @ ataebrahimi.com 
  Official public number: