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The testing center is currently It should be divided into 4 major laboratories, with a series of testing equipment for the semiconductor optoelectronic industry, and is gradually being improved according to market demand. The main services provided are: 1) Inspection and analysis services of semiconductor optoelectronic materials; 2) Inspection and analysis services of optoelectronic properties of semiconductor optoelectronic products and devices; 3) Device packaging technology and optoelectronic processing services.


Micro Characterization Lab:

场发射扫描电子显微镜(SEM)原子力显微镜(AFM),离子减薄仪,离子溅射镀膜仪,荧光光学显微镜 ,光学显微镜。 Focused ion beam-scanning electron microscope-spectroscopy system (FIB-SEM-EDX) , field emission scanning electron microscope (SEM) , atomic force microscope (AFM), ion thinner, ion sputtering coating instrument , fluorescence optical microscope , Optical microscope.


Photoelectric testing laboratory:

紫外可见近红外分光光度计(UV-Vis-NIR),绝对量子效率测试仪(PLQY),荧光光谱仪(PL),红外光谱仪(FTIR),激光拉曼光谱仪(Raman), 接触角测量仪,台阶仪(膜厚仪),轮廓仪(白光干涉仪),椭偏仪, 探针台 ,阻抗分析仪,IVL光电测试系统,太阳能伏安特性测试系统, X射线光电子能谱仪(XPS),色彩分析仪 半导体霍尔效应测试仪 冷热冲击试验箱 Atomic force microscope (EFM, KPFM, PFM, C-AFM), ultraviolet-visible near-infrared spectrophotometer (UV-Vis-NIR), absolute quantum efficiency tester (PLQY), fluorescence spectrometer (PL), infrared spectrometer (FTIR), Laser Raman spectrometer (Raman), contact angle meter, step meter (film thickness meter), profilometer (white light interferometer), ellipsometer, probe station , impedance analyzer, IVL photoelectric test system, solar voltammetry characteristics Test system, X-ray photoelectron spectrometer (XPS), color analyzer , semiconductor Hall effect tester , cold and hot shock test chamber


Structural analysis laboratory:

Nuclear magnetic resonance spectrometer (NMR), high performance liquid chromatography (HPLC), liquid chromatography-mass spectrometer (LC-MS), gas chromatography (GC), gas-mass spectrometer (GC-MS)


Component testing laboratory:

X射线衍射仪(XRD) ,热重及同步热分析(STD), 激光纳米粒度仪 Inductively coupled plasma mass spectrometer (ICP-MS), inductively coupled plasma emission spectrometer (ICP-OES) , X-ray diffractometer (XRD) , thermogravimetric and simultaneous thermal analysis (STD), laser nanometer particle size analyzer




  contact details: 
 
 
  电话: 0512-62316061,18962592662(殷老师) Telephone: 0512-62316061, 18962592662 (Ms. Yin) 
  Email: jczx@ataebrahimi.com, yiny @ ataebrahimi.com, songxx @ ataebrahimi.com 
  Official public number: